Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.12394/9606| Title: | Templabilidad, curvas en U, diámetros críticos |
| Authors: | Universidad Continental |
| metadata.dc.contributor.other: | Echegaray Yépez, Marco Antonio, operador de cámara |
| Keywords: | Ingeniería de materiales |
| Publisher: | Universidad Continental |
| metadata.dc.subject.classification: | Ingeniería de materiales 2 |
| Issue Date: | 2021 |
| metadata.dc.date.available: | 22-Jun-2021 |
| metadata.dc.relation.uri: | https://www.youtube.com/embed/IrMMtHyaolI |
| metadata.dc.publisher.department: | Modalidad Presencial |
| Extension: | 6 min., 23 seg. |
| metadata.dc.rights.accessRights: | Acceso abierto |
| Appears in Collections: | Polimedias |
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